便(bian)攜式智能型電(dian)纜(lan)0.1Hz交流耐(nai)壓(ya)試驗產品 VLF CR-28/40/60 ?同一臺(tai)儀器，可進(jin)行三類耐(nai)壓(ya)試驗：超低頻0.1 Hz交流；直流DC；外護套耐(nai)壓(ya) ?超輕便(bian)，兩節(jie)式zhuanli設計 ?0.1 Hz試驗頻率下超大試驗容(rong)量 ?內置自動放(fang)電(dian)單(dan)元，更(geng)安全 ?計算機導出(chu)試驗報告 根據電(dian)工委員會(hui)IEC60060標準(zhun)、電(dian)氣電(dian)子工程師協(xie)會(hui)IEEE400-2001標準(zhun)，余弦方波超低
VLF 耐壓測(ce)試(shi)配(pei)件(jian) ?輕松(song)連接各種不同的(de)無局放設備(bei)(bei)，進行局部(bu)放電測(ce)試(shi) ?使(shi)用單相(xiang) SF6 測(ce)試(shi)適配(pei)器 （TE PA-MC12/16） 進行診斷(duan) ?包括硅脂，用于完成*的(de)測(ce)試(shi)準(zhun)備(bei)(bei) VLF 連接套件(jian)可確保(bao) VLF 測(ce)量設備(bei)(bei)安(an)全、緊密地連接至被測(ce)設備(bei)(bei)。VLF 連接套件(jian)包含 3 相(xiang)鉗式適配(pei)器或 3 相(xiang) SF6 適配(pei)器。
70/120/160 kV 直(zhi)(zhi)流(liu)耐(nai)壓儀 直(zhi)(zhi)流(liu)耐(nai)壓儀 ?屬于空氣絕(jue)緣高(gao)壓產品中重量輕(qing) ?半波整流(liu)提(ti)供(gong)*的(de)表現(xian)及長時間的(de)可靠性 ??設計保證操作員的(de)安全 高(gao)壓直(zhi)(zhi)流(liu)介電(dian)測試儀提(ti)供(gong)較(jiao)可靠、便(bian)攜的(de)直(zhi)(zhi)流(liu)高(gao)壓來源以(yi)檢查電(dian)力電(dian)纜(lan)、發動(dong)機(ji)、開關設備、絕(jue)緣器、變壓器和電(dian)容器的(de)品質(zhi)。
0.1 Hz VLF余弦方波(bo)電纜耐(nai)壓試(shi)(shi)驗(yan)系統 VLF CR-60HP 及(ji)(ji) VLF CR-80 ?非常高的測(ce)試(shi)(shi)能(neng)量，沒(mei)有(you)頻率衰減 ?大電壓下可測(ce)試(shi)(shi)長達20 km的電纜 ?沒(mei)有(you)直流試(shi)(shi)驗(yan)下的極(ji)化現象 ?記錄試(shi)(shi)驗(yan)過程(cheng)及(ji)(ji)結(jie)果 ?擊穿識別功能(neng) ?泄漏電流測(ce)量
BITE蓄電(dian)(dian)池阻抗測(ce)(ce)試(shi)儀(yi)(yi)接(jie)收(shou)器 ?與傳統電(dian)(dian)池阻抗測(ce)(ce)試(shi)儀(yi)(yi)一(yi)同使用(yong) ?提供(gong)數據(ju)儲(chu)(chu)存功能 ?測(ce)(ce)量鉛酸電(dian)(dian)池和(he)(he)鎳鎘電(dian)(dian)池的(de)阻抗和(he)(he)直流電(dian)(dian)壓 電(dian)(dian)池阻抗測(ce)(ce)試(shi)儀(yi)(yi)接(jie)收(shou)器替換(huan)了(le)原來電(dian)(dian)池阻抗測(ce)(ce)試(shi)儀(yi)(yi)的(de)標準接(jie)收(shou)器。無需更換(huan)BITE發送器，新的(de)接(jie)收(shou)器就可(ke)以(yi)提供(gong)數據(ju)儲(chu)(chu)存功能。 接(jie)收(shou)器集導線、鉗(qian)形電(dian)(dian)流傳感器和(he)(he)數據(ju)儲(chu)(chu)存功能于(yu)一(yi)身，儀(yi)(yi)器可(ke)儲(chu)(chu)存超(chao)過(guo)2000組(zu)數據(ju)（電(dian)(dian)池單(dan)(dan)元(yuan)(yuan)阻抗、電(dian)(dian)池單(dan)(dan)元(yuan)(yuan)電(dian)(dian)壓及單(dan)(dan)元(yuan)(yuan)結合(he)部分(fen)的(de)電(dian)(dian)阻）。
BITE2/2P蓄電(dian)池(chi)阻(zu)抗測(ce)試儀 （蓄電(dian)池(chi)系統大 7000 Ah） ?測(ce)量(liang)7000 Ah以內的(de)鉛酸(suan)電(dian)池(chi)和鎳(nie)鎘(ge)電(dian)池(chi)的(de)狀況 ?面板帶有合格／警告／失敗指示 ?堅固(gu)耐(nai)用，良好的(de)測(ce)試重復性 ?在(zai)線(xian)測(ce)試 ?通過測(ce)量(liang)紋波電(dian)流來檢(jian)測(ce)充(chong)電(dian)器的(de)狀況
BITE3蓄(xu)電(dian)(dian)池(chi)(chi)阻(zu)抗測(ce)試(shi)儀 ?檢測(ce)容量(liang)(liang)2000 Ah以內(nei)鉛酸蓄(xu)電(dian)(dian)池(chi)(chi)狀(zhuang)況(kuang) ?在線測(ce)試(shi)，同(tong)時進行(xing)電(dian)(dian)池(chi)(chi)組(zu)合格(ge)／警(jing)告(gao)／失敗(bai)計算 ?測(ce)量(liang)(liang)電(dian)(dian)池(chi)(chi)組(zu)阻(zu)抗、相連電(dian)(dian)阻(zu)和電(dian)(dian)池(chi)(chi)電(dian)(dian)壓(ya) ?Windows CE運(yun)作系統，含32 MB內(nei)存(cun) ?測(ce)量(liang)(liang)浮充(chong)電(dian)(dian)流(liu)和紋波(bo)電(dian)(dian)流(liu) ?包括PowerDB LITE數據管理軟件(jian)
BGL蓄(xu)電(dian)(dian)(dian)(dian)(dian)(dian)池(chi)接地(di)故(gu)障(zhang)測(ce)試儀 ?強(qiang)大的(de)(de)將直流系(xi)統接地(di)故(gu)障(zhang)定位能(neng)力 ?能(neng)于高電(dian)(dian)(dian)(dian)(dian)(dian)氣(qi)干擾環境(jing)下操作(zuo) ?識別故(gu)障(zhang)特點（阻性和容(rong)性） 強(qiang)度，簡化故(gu)障(zhang)尋蹤(zong)過程 直流系(xi)統接地(di)故(gu)障(zhang)測(ce)試儀無需(xu)將直流系(xi)統停(ting)電(dian)(dian)(dian)(dian)(dian)(dian)，就(jiu)能(neng)進行直流系(xi)統接地(di)故(gu)障(zhang)的(de)(de)探(tan)測(ce)、尋蹤(zong)和定位！BGL型號尋蹤(zong)和定位有電(dian)(dian)(dian)(dian)(dian)(dian)或無電(dian)(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)(dian)池(chi)的(de)(de)接地(di)故(gu)障(zhang)，為了省卻(que)不必要(yao)的(de)(de)故(gu)障(zhang)檢修時間(jian)，BGL能(neng)即時分辨故(gu)障(zhang)電(dian)(dian)(dian)(dian)(dian)(dian)阻電(dian)(dian)(dian)(dian)(dian)(dian)流和電(dian)(dian)(dian)(dian)(dian)(dian)容(rong)充電(dian)(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)(dian)流，即使(shi)在(zai)(zai)浪涌(yong)抑制電(dian)(dian)(dian)(dian)(dian)(dian)容(rong)器(qi)存在(zai)(zai)的(de)(de)情(qing)況(kuang)下，儀器(qi)也
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