CDS電(dian)(dian)(dian)(dian)(dian)纜(lan)(lan)(lan)老化診(zhen)斷系統(tong) ?對PE/XLPE/油紙絕緣(yuan)電(dian)(dian)(dian)(dian)(dian)纜(lan)(lan)(lan)絕緣(yuan)無損的狀態評估 ?操作簡單，自(zi)動完(wan)成測(ce)量(liang)程(cheng)序(xu) ?同(tong)(tong)時(shi)測(ce)量(liang)電(dian)(dian)(dian)(dian)(dian)纜(lan)(lan)(lan)三相，全(quan)部(bu)完(wan)成僅需1小時(shi) ?采用等溫(wen)松弛(chi)電(dian)(dian)(dian)(dian)(dian)流法測(ce)試長(chang)電(dian)(dian)(dian)(dian)(dian)纜(lan)(lan)(lan)時(shi)可延長(chang)動態范圍(wei) ?極化過程(cheng)中同(tong)(tong)時(shi)測(ce)量(liang)充電(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)流 ?改良(liang)的濾波裝置 ?內置大容(rong)量(liang)充電(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)池，可連續測(ce)量(liang) ?極化電(dian)(dian)(dian)(dian)(dian)壓高5KV,同(tong)(tong)樣(yang)適(shi)用于高壓電(dian)(dian)(dian)(dian)(dian)纜(lan)(lan)(lan)的診(zhen)斷 便攜式電(dian)(dian)(dian)(dian)(dian)纜(lan)(lan)(lan)老化診(zhen)斷系統(tong)CDS廣(guang)泛應用于PE/X
TDS NT電(dian)(dian)(dian)纜(lan)測(ce)(ce)試和(he)診斷系統合(he)(he)一(yi) ?一(yi)臺(tai)設備中(zhong)包含兩個可(ke)靠(kao)的(de)(de)(de)電(dian)(dian)(dian)壓波形形狀(zhuang)(zhuang) ?符(fu)合(he)(he)標準的(de)(de)(de) VLF 電(dian)(dian)(dian)纜(lan)測(ce)(ce)試要求，附(fu)有 PD 診斷功(gong)能 ?通過(guo)(guo)可(ke)靠(kao)的(de)(de)(de) DAC 電(dian)(dian)(dian)壓完成(cheng)(cheng)非破壞(huai)性 PD 診斷 ?與工頻(pin)形成(cheng)(cheng)直接對(dui)比的(de)(de)(de) 50 Hz 斜率技術 當前，網絡運營商可(ke)以獲(huo)取(qu)更快的(de)(de)(de)速(su)度，并掌握(wo)有關(guan)其電(dian)(dian)(dian)纜(lan)質量(liang)和(he)狀(zhuang)(zhuang)態的(de)(de)(de)更可(ke)靠(kao)信息。這要歸(gui)功(gong)于全新的(de)(de)(de) 50Hz 斜率技術。它(ta)首次能夠(gou)在實際 PD 測(ce)(ce)量(liang)過(guo)(guo)程中(zhong)快速(su)定位地(di)下電(dian)(dian)(dian)纜(lan)中(zhong)的(de)(de)(de)
0.1 Hz VLF余弦方波(bo)電(dian)纜耐壓試(shi)驗(yan)系統 VLF CR-60HP 及 VLF CR-80 ?非常高的(de)測試(shi)能量，沒(mei)(mei)有頻率衰減 ?大電(dian)壓下可測試(shi)長達(da)20 km的(de)電(dian)纜 ?沒(mei)(mei)有直流試(shi)驗(yan)下的(de)極化(hua)現象 ?記(ji)錄(lu)試(shi)驗(yan)過程及結果 ?擊(ji)穿識(shi)別功能 ?泄漏電(dian)流測量
TORKEL900蓄(xu)電(dian)(dian)池(chi)放電(dian)(dian)試(shi)驗系(xi)(xi)統 ?放電(dian)(dian)測試(shi)，可充分了解電(dian)(dian)池(chi)容量 ?增強(qiang)的安全功能(neng)，包括無火花(hua)連接和應急保險絲 ?能(neng)夠(gou)在與系(xi)(xi)統不斷(duan)開連接的情況下測試(shi)電(dian)(dian)池(chi) ?高放電(dian)(dian)容量縮短了測試(shi)時間 ?完整、獨立的放電(dian)(dian)測試(shi)系(xi)(xi)統
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